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ESPRIT 2 – The Powerful 4-in-1 Software for Microanalysis

ESPRIT 2 is the completely newly designed micro- and nano-analysis software for SEM and TEM. The SEM package unites 4 methods under a single user interface, EDS, WDS, EBSD and Micro-XRF for SEM. The 64-bit software architecture supports handling of large datasets and improves analytical flexibility.

So, if you use an older ESPRIT version contact our sales team and get the upgrade!

New and improved features for EBSD

EBSD analysis with QUANTAX EBSD really gains momentum with ESPRIT 2. Here are the most important changes and additions in list form:

Click to enlarge: ESPRIT 2 EBSD Screen
  • Drift correction
  • Stage control (Jobs feature) now supports automated EBSD analysis, including stage mapping.
  • Manual pattern center calibration refinement (for expert and advanced level users).
  • Crystallography Open Database - is a new phase database that we are offering as an alternative to ICSD.
  • Dynamical simulations - Fast pattern simulation based on dynamical theory of electron diffraction; integrated in the phase editor window.
  • Improved advanced phase ID.
  • New and improved automatic EDS assisted phase discrimination.
  • Improved and user-friendlier signal setup window.
  • Automatic data saving at the end of the measurement.
  • Texture component map – possible to process ideal orientation and fiber components; subset selection is integrated.
  • Grain shape analysis and grain main axis inclination analysis; integration with subset selection feature.

Obtaining more information on your samples through method combinations

ESPRIT 2 makes it easy to combine methods, apart from EDS and EBSD, EDS and WDS and EDS and Micro-XRF for SEM are now supported.

Comparing L line spectra of molybdenum acquired with (solid) and without (outline) secondary collimating optics

WDS quantification has to be carried out standard-based. However, the analyst can now use the EDS spectrum that is always simultaneously measured for a combined EDS/WDS quantification. If the quantification of only one element is critical (e.g., boron as a light element), only a single standard needs to be measured. The user can save time quantifying other elements present in the sample standardlessly with EDS. The comfortable quantification window provides all that is needed (method editor, spectrum quant features and the respective results) at a glance. The user can choose by right clicking on an element in the periodic table whether an element should be quantified with EDS or WDS.

Combined EDS/ Micro-XRF quantification provides more accurate sample composition data. EDS can be used for the analysis of light and major elements and also minor elements. Trace elements and heavier elements are determined with Micro-XRF. In summary: the combined quantification of Micro-XRF and EDS spectra can improve overall results because of the simultaneous quantification of light and trace elements.

For more information on ESPRIT 2 visit Use the link to our form below to send us your details, and your local sales person will contact you and provide you with the upgrade options.

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